|
AUTHOR(S): Neumann Petr, Houser Josef, Navratil Milan, Kresalek Vojtech, Adamek Milan
|
TITLE |
 PDF |
KEYWORDS Counterfeit electronic component, Analogue Signature Analysis, pin print, I-V characteristics, X-ray inspection, delidding, decapsulation, laser ablation, final wet etching |
ABSTRACT This paper deals with an important topic aimed at counterfeit electronic components and their detection. The preventive technical diagnostics methods for counterfeit components revealing before entering the assembly process are mentioned and described. Practical methods for semiconductor component genuineness evaluation are discussed and illustrated with examples based on our research activities in relation to cooperation with electronic devices assembly manufacturers. The model case of counterfeit component discovery among spare parts and replaced parts in a company repairing measurement devices is given in the end of this paper. |
Cite this paper Neumann Petr, Houser Josef, Navratil Milan, Kresalek Vojtech, Adamek Milan. (2016) Semiconductor Component Genuineness Evaluation Methods. Circuits and Electronics, 1, 97-111 |
